Research
Photo-induced effects in ferroelectric thin film based devices
… films have reported photo-induced strain in the picosecond time range, thus opening a new route for ultrafast strain … Fig.: (Left) PZT ferroelectric capacitors measured by time-resolved X-ray diffraction, showing an in situ control … films have reported photo-induced strain in the picosecond time range, thus opening a new route for ultrafast strain …
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